MATERIAALIMIKROSKOOPIT
Nikon-materiaalimikroskoopit
Nikonilla on laaja valikoima mikroskooppeja erilaisiin materiaalitutkimuksen tarpeisiin.
Autamme mielellämme kokoonpanon suunnittelussa. Ota yhteyttä meihin lisätietoja, lisävarusteita tai mikroskooppihuoltoa varten.
Nikon ECLIPSE L300N(D) ja L200N(D)
Nikonin tunnustettu CFI60-optiikka, jykevä rakenne ja ergonominen muotoilu tekevät näistä mikroskoopeista ylivoimaisen työkalun piikiekkojen tarkasteluun.
- Nikon CFI60-2 Optical Series; Nikon’s innovative design enables clear imaging techniques, including high-contrast, brightfield, darkfield, polarization (POL), differential interference contrast (DIC) and double beam interferometry optical contrast.
- The microscope detects and controls the objective lens in use, light intensity, illumination and aperture via a USB connection to Nikon’s NIS-Elements software.
- Focusing aid; an optical target in the illumination path allows rapid, accurate focusing on low-contrast samples, e.g. bare wafers.
This saves considerable time and gives the user confidence that they are exactly in the right focus position.
- The eyepiece tube is of the trinocular tilting type, allowing continuous adjustment of the tilt angle from 0° to 30° for viewing at the optimum eyepoint level.
The eyepiece also features an ultra-widefield design and has an F.O.V. of 25mm.
- The X-Y fine-movement controls remain in the same position, close to the front, for a comfortable viewing posture regardless of the stage position.
In addition, these controls, plus the focus knob, are located close to each other so you can operate both with one hand.
- The main control knobs and buttons are located at the front of the microscope for easy access, quick and easy microscope operation while viewing samples is possible.
- L300N models for 300 mm diameter wafers, L200N models for 200 mm diameter wafers
- L300N and L200N models reflected illumination models, L300ND and L200ND reflected and transmitted illumination models
Mikroskoopin XYZ-motorisointi lisää työskentelyn tehokkuutta, stagen XY-liikettä ja fokusointia ohjataan joystickilla ja NIS-Elements -ohjelmalla.
Lue Nikonin Case-kertomuksia:
Case PragmatIC Semiconductor: Integrated circuits inspected faster and more accurately by using a Nikon microscope
Case: Nikon’s automated wafer inspection boosts productivity at Lawrence Semiconductor
Nikon ECLIPSE L200N/L300N esite:
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Piikiekkolaturi Nikon NWL200 Wafer Loader
Nikon NWL200 -kiekkolaturilla piikiekkojen siirto mikroskoopille ja takaisin kasettiin tapahtuu nopeasti, tarkasti ja automaattisesti. Mikroskopoinnin lisäksi kiekon visuaalinen tarkastelu kiekkolaturin makrotoiminnoilla (surface, backside center, backside edge).
Nikon NWL200 Wafer Loader -esite:
Katso Youtubessa Nikon Metrologyn NWL200 Wafer Loader -esittelyvideo:
Nikon ECLIPSE LV -sarja
Nikon ECLIPSE LV -materiaalimikroskoopit soveltuvat erinomaisesti monipuolisiin teollisuuden sovelluksiin.
Nikonin huippulaadukkaat CFI60-2 objektiivit tarjoavat korkean numeerisen apertuurin ja pitkän työskentelyetäisyyden.
Tarjolla on laaja valikoima havaintomenetelmiä (katso tarkemmin mallikohtaiset esittelyt alla)
Nikon ECLIPSE MA200 -käänteismikroskooppi
ECLIPSE MA200 on innovatiivisesti muotoiltu materiaalikäänteismikroskooppi, jossa digitaalinen kuvantaminen ja ergonominen tehokkuus on optimoitu.
- Compatible with brightfield, darkfield, simple polarizing, DIC and fluorescence observation methods.
- User-Friendly Operation
- All controls are on the front of the instrument for maximum operability.
- Quick Status Check; the observation position of the objective lens and sample can be checked easily from the microscope's front panel.
- Analyzer/Polarizer Interlock Mechanism links the attachment/release of the analyzer/polarizer.
- Brightfield/Darkfield Auto-aperture Switching; The field stop and aperture stop automatically open when switched from brightfield to darkfield. When returning to brightfield observation,the previous field and aperture stop settings are reproduced.
- Flash Prevention Mechanism; Reflection flashes when switching objective lenses are automatically prevented.
- The MA200 features a super-wide field of view with an eyepiece diameter of 25mm.
With the combination of the newly developed 1x objective lens, a sample of 25mm diameter can be observed in a single field of view.
- Improved uniformity of illumination delivers clear images, especially for digital imaging.
- Nikon's Digital Sight microscope cameras and NIS-Elements Imaging Software
allow the user to perform everything from basic image capture to the measurement, analysis, and management of captured images.
- Status Display displays information such as objective lens magnification and illumination conditions.
The calibration data is automatically changed when the objective magnification is changed.
This feature makes the measurement function and other optional software modules such as grain sizing and cast iron analysis module in the NIS-Elements easy to use.
- Stitching; Adjacent images can be put together to create an image with a wide field. It is now possible to capture even more vivid images due to the improved uniformity of the illumination system.
- Grain Size Measurement; Measures grain size and displays results based on JIS and ASTM standards.
- Graphite Nodularity Measurement; Measures the graphite nodularity of ground cast iron and displays results based on JIS nd ASTM standards.
Nikon ECLIPSE MA100N ja MA200 -esite:
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Nikon ECLIPSE MA100N -käänteismikroskooppi
ECLIPSE MA100N on kompakti käänteismikroskooppi, joka soveltuu erinomaisesti metallurgiseen tutkimukseen ja elektronisten komponenttien tarkasteluun sekä tuotannon materiaalitutkimukseen ja laaduntarkkailuun.
- Compatible with brightfield and simple polarizing observation methods.
- Stable control even with heavy samples - A newly developed stage boasting superior durability.
Nikon developed the new MA-SR-N Rectangular Stage especially for the MA100N.
The three-plate structure gives the microscope superior control and durability for observation of heavy samples, such as a grinder resin mounted samples
- Employment of high-intensity LED illumination (Eco-illumination).
Compared to conventional halogen illumination, these high intensity LED sources need only about one third of consuming electricity and last approximately 30 times longer.
The MA100N ensures stable sample observation with uniform color temperature even in different light intensity
- The epi illuminator comes standard with a variable aperture diaphragm to control image contrast and depth of field
- Compact body; The MA100N is a model designated for LED illumination, which enables users to save about 11% of footprint and have more installation choices
Nikon ECLIPSE MA100N ja MA200 -esite:
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Nikon on johtava optisten instrumenttien valmistaja. Yhtiö on perustettu Japanissa vuonna 1917.
Yli 100-vuotisen toimintansa aikana Nikon on kehittänyt edistyneitä ja tinkimättömän laadukkaita mikroskooppeja ja muita optisia laitteita.
Tänä päivänä Nikon Metrology tarjoaa laajan tuotevalikoiman mikroskopia- ja mittalaitteita.
Ota yhteyttä lisätietoja varten.
Sivustolinkit:
Jaso Oy
Tuulimyllyntie 4
14200 Turenki
y-tunnus: 1057298-5
Puhelin: 03 68 78 797
e-mail: jaso@jaso.fi
