Accurate sub-nano-surface profiler with non-contact measurement
Nikon’s proprietary scanning-type optical interference measurement technology achieves 1 picometer (pm) height resolution. Nikon offers a variety of optical microscopes as measurement systems to suit a wide range of measurement applications.
KEY BENEFITS
Superior measurement performance
Wide range of observation methods
SiC Wafer: Sub-nano-level measurement in a wide range of magnifications
Type: BW-D501 system, Subject: Silicon Carbide (SiC) Wafer
Nano-level measurement of razor-edge with high-magnification lens
Subject: Razor-edge
Surface roughness of paper (Synthetic, Plain, Gloss, Matte)
Surface roughness of ceramics
Precise surface measurements for micrometer-range rough surfaces
Type: BW-A501 system, Subject: Membrane of synthesized diamond using in-liquid plasma chemical vapor deposition, Photos courtesy of Ph.D. Hiromichi Toyota, Ehime University Graduate School of Science and Engineering
IC package: Micrometer-range measurement in a wide range of magnifications
Height calibration with the NIST-certified VLSI standard
BW-D501 system
Nikon on johtava optisten instrumenttien valmistaja. Yhtiö on perustettu Japanissa vuonna 1917.
Yli 100-vuotisen toimintansa aikana Nikon on kehittänyt edistyneitä ja tinkimättömän laadukkaita mikroskooppeja ja muita optisia laitteita.
Tänä päivänä Nikon Metrology tarjoaa laajan tuotevalikoiman mikroskopia- ja mittalaitteita.
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