MATERIAALIMIKROSKOOPIT
Nikon ECLIPSE LV -sarja
Nikon ECLIPSE LV -materiaalimikroskoopit soveltuvat erinomaisesti monipuolisiin teollisuuden sovelluksiin.
Nikonin huippulaadukkaat CFI60-2 objektiivit tarjoavat korkean numeerisen apertuurin ja pitkän työskentelyetäisyyden.
Tarjolla on laaja valikoima havaintomenetelmiä (katso tarkemmin mallikohtaiset esittelyt alla)
Nikon ECLIPSE L200N ja L300N
Nikonin tunnustettu CFI60-optiikka ja huipputehokas valaistus tekevät näistä mikroskoopeista ylivoimaisen työkalun piikiekkojen tarkasteluun.
- CFI60 Optical System provides outstandingly clear, sharp images with longer working distances, high numerical aperture (NA) and minimal flare. Signal to background ratios during darkfield observations are three times better than before to provide outstanding high contrast images ideal for high precision observations.
- The high intensity 12V-50W halogen illuminator, (LV-LH50PC) provides greater brightness than that of a 12V-100W halogen illuminator with half the power consumption. This new lamphouse incorporates a rear mirror and optimized lamp filament size to allow effective and uniform illumination on the pupil plane which is critical in an optical plane.
- The eyepiece tube is of the trinocular tilting type, allowing continuous adjustment of the tilt angle from 0° to 30° for viewing at the optimum eyepoint level.
The eyepiece also features an ultra-widefield design and has an F.O.V. of 25mm.
- The X-Y fine-movement controls remain in the same position, close to the front, for a comfortable viewing posture regardless of the stage position.
In addition, these controls, plus the focus knob, are located close to each other so you can operate both with one hand.
- The main control knobs and buttons are located at the front of the microscope for easy access, quick and easy microscope operation while viewing samples is possible.
- L200N models for 200 mm diameter wafers, L300N models for 300 mm diameter wafers
- L200N and L300N models reflected illumination models, L200ND and L300ND reflected/transmitted illumination models
Lataa Nikon ECLIPSE L200N/L300N esite tästä
Piikiekkolaturi Nikon NWL200 Wafer Loader
Nikon NWL200 -kiekkolaturilla piikiekkojen siirto mikroskoopille ja takaisin kasettiin tapahtuu nopeasti, tarkasti ja automaattisesti. Mikroskopoinnin lisäksi kiekon visuaalinen tarkastelu kiekkolaturin makrotoiminnoilla
(surface, backside center, backside edge).
Lataa Nikon NWL200 Wafer Loader -esite tästä
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Nikon ECLIPSE MA100N -käänteismikroskooppi
ECLIPSE MA100N on kompakti käänteismikroskooppi, joka soveltuu erinomaisesti metallurgiseen tutkimukseen ja elektronisten komponenttien tarkasteluun sekä tuotannon materiaalitutkimukseen ja laaduntarkkailuun.
- Compatible with brightfield and simple polarizing observation methods.
- Stable control even with heavy samples - A newly developed stage boasting superior durability.
Nikon developed the new MA-SR-N Rectangular Stage especially for the MA100N.
The three-plate structure gives the microscope superior control and durability for observation of heavy samples, such as a grinder resin mounted samples
- Employment of high-intensity LED illumination (Eco-illumination).
Compared to conventional halogen illumination, these high intensity LED sources need only about one third of consuming electricity and last approximately 30 times longer.
The MA100N ensures stable sample observation with uniform color temperature even in different light intensity
- The epi illuminator comes standard with a variable aperture diaphragm to control image contrast and depth of field
- Compact body; The MA100N is a model designated for LED illumination, which enables users to save about 11% of footprint and have more installation choices
Lataa Nikon ECLIPSE MA100N ja MA200 -esite tästä
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Nikon ECLIPSE MA200 -käänteismikroskooppi
ECLIPSE MA200 on innovatiivisesti muotoiltu materiaalikäänteismikroskooppi, jossa digitaalinen kuvantaminen ja ergonominen tehokkuus on optimoitu.
- Compatible with brightfield, darkfield, simple polarizing, DIC and fluorescence observation methods.
- User-Friendly Operation
- All controls are on the front of the instrument for maximum operability.
- Quick Status Check; the observation position of the objective lens and sample can be checked easily from the microscope's front panel.
- Analyzer/Polarizer Interlock Mechanism links the attachment/release of the analyzer/polarizer.
- Brightfield/Darkfield Auto-aperture Switching; The field stop and aperture stop automatically open when switched from brightfield to darkfield. When returning to brightfield observation,the previous field and aperture stop settings are reproduced.
- Flash Prevention Mechanism; Reflection flashes when switching objective lenses are automatically prevented.
- The MA200 features a super-wide field of view with an eyepiece diameter of 25mm.
With the combination of the newly developed 1x objective lens, a sample of 25mm diameter can be observed in a single field of view.
- Improved uniformity of illumination delivers clear images, especially for digital imaging.
- Nikon's Digital Sight microscope cameras and NIS-Elements Imaging Software
allow the user to perform everything from basic image capture to the measurement, analysis, and management of captured images.
- Status Display displays information such as objective lens magnification and illumination conditions.
The calibration data is automatically changed when the objective magnification is changed.
This feature makes the measurement function and other optional software modules such as grain sizing and cast iron analysis module in the NIS-Elements easy to use.
- Stitching; Adjacent images can be put together to create an image with a wide field. It is now possible to capture even more vivid images due to the improved uniformity of the illumination system.
- Grain Size Measurement; Measures grain size and displays results based on JIS and ASTM standards.
- Graphite Nodularity Measurement; Measures the graphite nodularity of ground cast iron and displays results based on JIS nd ASTM standards.
Lataa Nikon ECLIPSE MA100N ja MA200 -esite tästä
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Nikon on johtava optisten instrumenttien valmistaja. Yhtiö on perustettu Japanissa vuonna 1917.
Yli 100-vuotisen toimintansa aikana Nikon on kehittänyt edistyneitä ja tinkimättömän laadukkaita mikroskooppeja ja muita optisia laitteita.
Tänä päivänä Nikon Metrology tarjoaa laajan tuotevalikoiman mikroskopia- ja mittalaitteita.
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Euromex Oxion -materiaalimikroskooppi
- Trinocular
- Eyepieces; DIN WF 10x/22 mm
- Head; Siedentopf trinocular with 30° inclined tubes. Interpupillary distance 50-75 mm. Diopter adjustment on both eyepieces.
- Revolving quintuple reversed nosepiece on ball-bearings
- Objectives; Standard equipped with infinity corrected achromatic DIN Long working distance LWD Plan achromatic M-IOS 5x/0.14, 10x/0.25 and Plan semi-apochromatic LWD Plan 50x/0.55 and 100x/0.80 DIN objectives. All optical parts are anti-fungus treated.
- Standard 150 mm x 140 mm stage with 76 mm x 50 mm integrated mechanical stage.
- In height adjustable N.A. 1,25 Abbe condenser with filter holder.
- Coaxial coarse and fine adjustments, 2 µm precision. Friction adjustment
- Diascopic intensity adjustable 3 W NeoLEDTM illumination with internal 85-240 V power supply
- Reflected epi-Illumination; Intensity adjustable 3 W NeoLEDTM illumination with external 90-240 V power supply. Push-pull type 90° rotatable polarizer and fixed analyzer. Built-in condenser with field and aperture iris diaphragm. Oblique lighting feature.
Lataa Euromex Oxion-mikroskoopin esite tästä
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Euromex Microscopen on hollantilainen mikroskooppivalmistaja, joka on perustettu vuonna 1966.
Yhtiön valmistamia Euromex ja Novex -mikroskooppeja myydään yli 80 maassa, tähän mennessä yhtiö on toimittanut yli miljoona mikroskooppia.
Euromex takaa mikroskooppiensa ja muiden instrumenttiensa varaosien saatavuuden 20 vuodeksi. Yhtiö on ISO 9001:2008 -sertifioitu.
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Sivustolinkit:
Jaso Oy
Tuulimyllyntie 4
14200 Turenki
y-tunnus: 1057298-5
Puhelin: 03 68 78 797
e-mail: jaso@jaso.fi
